To reduce the impact of insufficient dual-pulse testing caused by uneven current sharing among parallel power devices, a study is conducted on the dual-pulse testing method for parallel power devices. Taking IGBT as an example, the principle of double-pulse testing is investigated, and a theoretical model for the uneven current sharing degree of parallel power devices under modified current loop paths is established and experimentally validated. The results show that modifying the current loop path can reduce the uneven current sharing among parallel power devices, consistent with the theoretical model. At 400 V, the uneven current sharing degree decreases from 43 % to 3.2 %. Under 1 500 V and at 1.2 and 1.4 times current overloads, the uneven current sharing degree is 2.8 %, enabling the successful completion of dual-pulse testing for all power devices and resolving the issue of insufficient testing due to uneven current sharing. Research results provide theoretical and experimental foundations for comprehensive dual- pulse testing of multiple parallel power devices.