为减小因并联功率器件不均流导致双脉冲测试不充分问题带来的影响，对并联功率器件的双脉冲测试方式进行了研究。以IGBT为例对双脉冲测试原理进行研究，建立了更改电流回路路径下并联功率器件双脉冲测试电流不均流度的理论模型，并通过实验进行了验证。结果表明，通过对比实验发现更改回路电流路径可以减小并联功率器件电流的不均流度，与理论模型相符；400 V电压下电流不均流度由43 %降至3.2 %；1 500 V电压下电流1.2倍及1.4倍的过载时功率器件的不均流度为2.8 %，可以充分完成所有功率器件的双脉冲测试，解决了由于不均流导致测试不充分的问题。研究成果为多并联功率器件的双脉冲充分测试提供理论及实验基础。

To reduce the impact of insufficient dual-pulse testing caused by uneven current sharing among parallel power devices, a study is conducted on the dual-pulse testing method for parallel power devices. Taking IGBT as an example, the principle of double-pulse testing is investigated, and a theoretical model for the uneven current sharing degree of parallel power devices under modified current loop paths is established and experimentally validated. The results show that modifying the current loop path can reduce the uneven current sharing among parallel power devices, consistent with the theoretical model. At 400 V, the uneven current sharing degree decreases from 43 % to 3.2 %. Under 1 500 V and at 1.2 and 1.4 times current overloads, the uneven current sharing degree is 2.8 %, enabling the successful completion of dual-pulse testing for all power devices and resolving the issue of insufficient testing due to uneven current sharing. Research results provide theoretical and experimental foundations for comprehensive dual- pulse testing of multiple parallel power devices.